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Dr. David Diercks

Research Professor

Colorado Center for Advanced Ceramics

Metallurgical and Materials Engineering

Colorado School of Mines

ddiercks@mines.edu

 

 

 

 

David R Diercks

Research Assistant Professor

 

 

Degrees:

B.S. Ceramic Engineering, University of Illinois – Urbana/Champaign (1997).

M.S. Materials Science and Engineering, University of Illinois – Urbana/Champaign (1999).

Ph.D. Materials Science and Engineering, University of North Texas (2007).

 

 

Experience:

 

2011-present Research Assistant Professor, Department of Metallurgical and Materials Engineering, Colorado School of Mines

 

2010-2011 Adjunct Professor, Department of Materials Science and Engineering, University of North Texas, Denton, TX

 

2007-2011 Research Scientist and Manager of the Center for Advanced Research and Technology (CART), University of North Texas

 

2004-2007 Research Assistant, University of North Texas

 

1999-2004 Network Engineer, Level 3 Communications

 

1996-1999 Research Assistant, University of Illinois at Urbana/Champaign

 

 

Patents

"Method For Preparing Specimens For Atom Probe Analysis and Specimen Assemblies Made Thereby" (submitted 8/11/08)

 

 

Scientific and Professional Societies

 

American Ceramic Society

Microscopy Society of America

 

Recent Publications and Presentations

 

Joseph R. Brewer, Robert M. Jacobberger, David R. Diercks, and Chin Li Cheung "Rare Earth Hexaboride

Nanowires: General Synthetic Design and Analysis Using Atom Probe Tomography" Chem. Mater., 23, 2606 (2011).

 

Somesree GhoshMitra, David R. Diercks, Nathaniel C. Mills, DiAnna L. Hynds, and Santaneel Ghosh "Excellent

biocompatibility of semiconductor quantum dots encased in multifunctional poly(N-isopropylacrylamide)

nanoreservoirs and nuclear specific labeling of growing neurons" Appl. Phys. Lett. 98, 103702 (2011).

 

A. V. Svalov, G. V. Kurlyandskaya, V. O. Vas'kovskiy, A. N. Sorokin, and D. Diercks "Magnetoresistance in

nanostructured Tb/Ti and Tb/Si multilayers" J. Appl. Phys. 109, 023914 (2011).

 

P.R. Poudel, B. Rout, D.R. Diercks, Y.M. Strzhemechny, F.D. McDaniel "Fluence dependant formation of β -SiC by

ion implantation and thermal annealing" Appl Phys A, 104, 183 (2011).

 

D Diercks, G Lian, J Chung, M Kaufman "Comparison of convergent beam electron diffraction and geometric phase

analysis for strain measurement in a strained silicon device" J of Microsc, 241, 195 (2011).

 

Grant Hudish, David Diercks, Anita Garg, Ronald Noebe, Michael Kaufman "Phase Equilibria and Transformations in

the Ti-Pt and Ti-Pt-Ni Systems" Materials Science and Technology conference, Houston, TX, October 2010. Invited.

 

Brian P Gorman, David Diercks, Harvey L Guthrey "Atomic Scale Characterization of Interfaces and Phase

Transitions using Cross-Correlative TEM, Diffraction, and Atom Probe Tomography" Materials Science and

Technology conference, Houston, TX, October 2010. Invited.

 

D Diercks, G Lian, J Chung, M Kaufman "Direct Comparison of Convergent Beam Electron Diffraction and Geometric

Phase Analysis for Local Strain Measurement" Microsc Microanal 16, 742 (2010).

 

L. Kovarik, F. Yang, A. Garg, D. Diercks, M. Kaufman, R.D. Noebe, M.J. Mills "Structural analysis of a new

precipitate phase in high-temperature TiNiPt shape memory alloys" Acta Materialia, 54, 4660 (2010).

 

David Diercks, Andrey V. Svalov, Michael Kaufman, Vladimir O. Vaskovskiy, Galina V. Kurlyandskaya "Structure

and Electrical Resistivity of Sputtered Tb/Ti and Tb/Si Magnetic Multilayers" IEEE Transactions on Magnetics 46,

1515 (2010).

 

D.R. Diercks, M.J. Kaufman, R.B. Irwin, A. Jain, L. Robertson, J.W. Weijtmans, R. Wise "Using a <670> zone axis

for convergent beam electron diffraction measurements of lattice strain in strained silicon" J of Microsc, 239, 154

(2010).

 

Santaneel Ghosh, Somesree GhoshMitra, Tong Cai, David R. Diercks, Nathaniel C. Mills, DiAnna L.

Hynds "Alternating Magnetic Field Controlled, Multifunctional Nano-Reservoirs: Intracellular Uptake and Improved

Biocompatibility" Nanoscale Research Letters 5, 195 (2010).

 

Mohammad H Maneshian, Ming-Te Lin, David Diercks, Nigel D Shepherd "Structural and electrical characterization

of ohmic contacts to graphitized silicon carbide" Nanotechnology, 20, 495703 (2009).

 

D.R. Diercks, B. P. Gorman, C.L. Cheung, G. Wang "Techniques for Consecutive TEM and Atom Probe Tomography

Analysis of Nanowires" Microsc Microanal 15(Suppl 2), 254 (2009).

 

Gonghua Wang, Joseph R. Brewer, Jie Ying Chan, David R. Diercks, and Chin Li Cheung "Morphological Evolution

of Neodymium Boride Nanostructure Growth by Chemical Vapor Deposition" J. Phys. Chem. C, 113, 10446 (2009).

 

David Diercks, Michael Kaufman, Alan Needleman "Convergent Beam Electron Diffraction Measurements of

Relaxation in Strained Silicon Using Higher Order Laue Zone Line Splitting" Journal of Applied Physics, 105, 063526

(2009).

 

T. W. Scharf, D. R. Diercks, B. P. Gorman, S. V. Prasad, M. T. Dugger "Atomic Layer Deposition of Tungsten

Disulphide Solid Lubricant Nanocomposite Coatings on Rolling Element Bearings" Tribology Transactions 52, 284

(2009).

 

Dave Diercks, "Convergent Beam Electron Diffraction in Materials Characterization" Florida American Vacuum

Society Meeting, Orlando, FL, March 2009. Invited.

 

D.R. Diercks, M.J. Kaufman, A. Needleman "Simple Method for Estimating Relaxation in Silicon from Higher Order

Laue Zone Line Splitting" Microsc Microanal 14(Suppl 2), 850 (2008).

 

D.R. Diercks, M.J. Kaufman "Comparison of Zone Axes for Convergent Beam Electron Diffraction Strain

Measurements of a Strained Silicon Transistor" Microsc Microanal 14(Suppl 2), 852 (2008).

 

Brian P. Gorman, David R. Diercks, David Jaeger "3-D Cross-Correlation of Atom Probe and STEM Tomography"

Microsc Microanal 14(Suppl 2), 1042 (2008).

 

Brian P. Gorman, David Diercks, Norman Salmon, Eric Stach, Gonzalo Amador, Cheryl Hartfield "Hardware and

Techniques for Cross-Correlative TEM and Atom Probe Analysis" Microscopy Today 16(4), 42 (2008). Invited.

 

Brian P. Gorman, Anantha Puthucode, David R. Diercks, Michael J. Kaufman "Cross-correlative TEM and Atom

Probe Analysis of Precipitation in NiNbSn Metallic Glasses" Materials Science and Technology, 24 [6], 682 (2008).

Invited.

 

Santaneel Ghosh, Arup Neogi, Chao Yang, Tong Cai, Somesree GhoshMitra, David Diercks, Zhibing

Hu "Thermoresponsive Hydrogel Microvalve Based on Magnetic Nanoheaters for Microfluidics" Mater. Res. Soc.

Symp. Proc. 1095, 1095-EE03-20 (2008).

 

David R. Diercks, "Using a Modern Research Center for Investigating Materials on the Nanoscale" Southeast

Missouri St., October 22, 2008. Invited.

 

 

Research Interests

 

• Mechanical properties and behavior of materials, especially at micro- and nano-scales

• Stress-driven failure in renewable energy materials

• Nanomechanical testing at elevated temperatures

• Traditional and novel microfabrication methods

 

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